OCAS’ s TEM Thermofisher Scientific Talos F200X G2 is equipped with a FEG …

FIB/SEM dual beam

OCAS recently purchased a state-of-the-art FIB/SEM system (SCIOS …


Atom probe tomography is a unique materials’ characterisation technique, …

FEG-EPMA with SXES detector

The electron probe microanalyzer (EPMA) is widely used in industry and academia to relate microstructural features to their chemical composition. Our JEOL 8530F FEG-EPMA belongs to the latest generation of electron microprobes. It is routinely used to image and quantify chemical composition of solid specimen at the microscale. The Field Emission Gun (FEG) delivers a bright and stable electron beam over a wide range of analytical conditions (accelerating voltage and probe current) that are especially suitable to perform imaging and quantitative analysis at high (sub-micron) spatial resolution. Elements from B to U can be detected even at very low quantity (<0.1 wt%).

FEG-SEM, including EBSD

Scanning electron microscopy (SEM) provides morphological and elemental information of the surface of a sample. Our SEM (JEOL JSM-7001F SHL) is equipped with a Field Emission Gun (FEG) which greatly enhances available electron image resolution (down to a few nm), necessary to observe fine grained microstructures, surface defects, thin coatings, etc.

Only a selection of our microscopy service offer is shown above. Contact us for more information on tools, prices and availability.