(S)TEM
OCAS’ s TEM Thermofisher Scientific Talos F200X G2 is equipped with a FEG …
OCAS’ s TEM Thermofisher Scientific Talos F200X G2 is equipped with a FEG (Field Emission Gun) and super-X EDS (Energy Dispersive X-ray) system. FEG enables atomic resolution (S)TEM imaging. Super-X EDS system offers four EDS detectors with collimator, which is ideal for analytical characterisation. Our recently developed APW (Automated Particle Workflow) can exponentially increase precipitate analysis efficiency.
Kind of services:
- APW
- EDX
- Diffraction
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FIB/SEM dual beam
OCAS recently purchased a state-of-the-art FIB/SEM system (SCIOS …
FIB/SEM dual beam
To replace its current FIB, OCAS recently purchased a state-of-the-art FIB/SEM system (SCIOS 2 from Thermofisher Scientific), which will be operational 2021Q4. Dual beam FIB/SEM systems incorporate focused ion beam (FIB) and scanning electron microscope (SEM).
In contrast to the sample preparation, the microscopy applications of the FIB/SEM dual beam can provide analytical information without the need for an additional technique. Main examples of microscopy applications are cross-sectioning and FIB/SEM tomography. These applications combined with information from our EDS system, incorporated into the dual beam, allow to obtain 3D-compositional information. Another aspect of FIB/SEM application is its micro machining, where the FIB/SEM system is used to create microscale structures or deposit conductive lines. FIB/SEM micro-machining can be used to create micro-electromechanical systems (MEMS) which are micro-scale devices with moving parts. With improvement in FIB and SEM resolution a field of nano-machining is also emerging.
The FIB is mainly used for the site-specific material removal and SEM enables non-destructive imaging. The dual beams are multi-functional systems and can be used for sample preparation, microscopy applications and micro-machining. The most common sample preparation applications are TEM and APT specimen fabrication. Thanks to its high-resolution SEM column and STEM detector, our new instrument allows, site-specific sample preparation with high precision. It also enables automatic TEM sample preparation for high throughput applications.
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APT
Atom probe tomography is a unique materials’ characterisation technique, …
APT
Atom probe tomography is a unique materials’ characterisation technique, enabling both 3D-imaging and chemical compositional analysis at the atomic scale. OCAS has access to a Cameca LEAP 5000 XR APT through the Hercules foundation for large scale research infrastructure with a consortium of three Universities (Leuven, Hasselt and Ghent) since 2015. According to the manufacturer, the LEAP 5000 XR is the most capable atom probe across the widest variety of research and development applications.
During the past years, this APT supported OCAS with an advanced characterisation of precipitates, coatings, grain and phase boundaries. In many occasions the insight provided by APT, helped to adopt the production process to solve real life problems. The technique is well suited for analysis of nanoscale precipitates, revealing their volume fraction, morphology and composition. Hence, it allows to study the evolution of precipitates at different stages of thermal treatment. APT also can reveal nanoscale compositional variations and interfacial contamination in different coatings which can be crucial for their functionality. In addition, APT is the only technique to study the impurity segregation at grain and phase boundaries, which have significant impact on macroscopic properties of different materials including steels.
Case studies:
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FEG-EPMA with SXES detector
Our JEOL 8530F FEG-EPMA belongs to the latest generation…
FEG-EPMA with SXES detector
FEG-EPMA with SXES detector
The electron probe microanalyzer (EPMA) is widely used in industry and academia to relate microstructural features to their chemical composition. Our JEOL 8530F FEG-EPMA belongs to the latest generation of electron microprobes. It is routinely used to image and quantify chemical composition of solid specimen at the microscale. The Field Emission Gun (FEG) delivers a bright and stable electron beam over a wide range of analytical conditions (accelerating voltage and probe current) that are especially suitable to perform imaging and quantitative analysis at high (sub-micron) spatial resolution. Elements from B to U can be detected even at very low quantity (<0.1 wt%).
SXES detector
A Soft X-ray Emission Spectrometer (SXES – JEOL SS-94000) improves the analytical performance of our EPMA toward the quantification of light elements (Li to F). The detection limit of this spectrometer is 5 to 10 times better than the classical wavelength dispersive spectrometers (WDS). It has an energy resolution of 0.3 eV that is more than one order of magnitude higher than WDS. With such high energy resolution, it is possible to probe the chemical state of elements from their spectrum peak shape. For instance, the SXES spectrum of nitrogen is completely different whether it is present in the form of nitrides or nitrates and can be differentiated.
Specifications of our equipment
Case studies
Pushing the detection limit of light elements
Ultimate lateral resolution reveals complexity of microstructure
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FEG-SEM, including EBSD
Scanning electron microscopy (SEM) provides morphological and elemental information …
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FEG-SEM, including EBSD
FEG-SEM, including EBSD
Scanning electron microscopy (SEM) provides morphological and elemental information of the surface of a sample. Both our SEMs (JEOL JSM-7001F SHL and JEOL JSM-IT 800SHL) are equipped with a Field Emission Gun (FEG) which greatly enhances available electron image resolution (down to a few nm), necessary to observe fine grained microstructures, surface defects, thin coatings, etc.
Its analytical capabilities are complemented by:
Electron Backscattered Diffraction (EBSD) used for phase/structure identification and lattice orientation analysis of crystallised samples.
- Our EBSD system on the JEOL JSM-7001F SHL is an Oxford Instruments Nordlys F detector used with Aztec software for fast and automated indexation of EBSD patterns.
- The JEOL JSM-IT 800SHL is equipped with an Oxford Symmetry S3 detector used with Aztec software for even faster analysis and EBSD analysis with a higher spatial resolution.
- The AztecCrystal software can be used for advanced data post-processing on both systems.
Energy Dispersive spectrometer (EDS) used for chemical distribution analysis.
- The EDS system used on the JEOL JSM-7001F SHL is an Oxford Instruments INCA X-act detector used with INCA software for chemical distribution mappings/point analysis.
- An Ultim Max 100 EDS detector is used on the JEOL JSM-IT 800SHL for chemical distribution mappings/point analysis and automated feature analysis.
Wavelength Dispersive spectrometer (WDS) used for chemical distribution analysis. Our WDS system is an Oxford Instruments INCA Wave detector used with INCA software which is only installed on the JEOL JSM-7001F SHL.
Additional features of the JEOL JSM-IT 800SHL FEG-SEM include:
- An integrated plasma cleaner to ensure chamber and sample cleanliness.
- A specific set-up of the detectors which enables us to perform EBSD and EDS mappings simultaneously.
- A large sample holder for high-throughput automated EBSD or EDS analysis.
Nano indentation
OCAS’ newest Bruker TI Premier nano indentator delivers the highest degree of performance …
Nano indentation
OCAS’ newest Bruker TI Premier nano indentator delivers the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. It is a versatile nanomechanical test instrument for advanced material characterization.
Equipment testing modes are for example:
- Quasi-static nanoindentation
- SPM imaging
- Accelerated property mapping (XPM)
- Dynamical nanoindentation (nanoDMA)
- Wear test at nanoscale
Link to nano indentor tool specifications.
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Only a selection of our microscopy service offer is shown above. Contact us for more information on tools, prices and availability.